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Terahertz Spectroscopic / Imaging Analysis System
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Electronic Measuring Instruments
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Tests SoC/Mixed-Signal Devices at Low Cost
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SoC devices used in digital consumer products such as televisions and DVD recorders employ analog circuitry and memory interfaces delivering increasingly high performance. While these advances enable new capabilities, they also demand a new level of test performance. By utilizing test modules which incorporate leading-edge test technology, the T6577 ably provides the highest-quality and lowest -cost parallel device test available in the industry.
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Flexible support for a wide variety of parallel test needs
The T6577 is an SoC test system offering support for a maximum of 1024 logic and/or I/O channels. It can perform parallel test (OS parallel test) of up to 32 devices, and allows an exceptional range of parallel test functionality, such as flexible pin assignments and testing odd numbers of devices. It will greatly contribute to lowering the cost of test for devices of any pin count. |
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Allows test of a wide variety of mixed-signal devices
When equipped with a high-accuracy, broadband, mixed-signal option, the T6577 can test mixed-signal devices in a wide frequency range from audio to video bands. With a test head developed to minimize noise, the T6577 can respond to the needs of tests sensitive to low voltage and high performance. Furthermore, newly developed options will enable it to support baseband, DVD read channel, and jitter test. |
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At-speed test of increasingly fast memory interfaces
When equipped with the DDR2 IF Test Option, the T6577 can perform cost-optimized, at-speed test of high-speed memory interfaces. With test rates of up to 667 Mbps, and a maximum of eight channels (DQS) or sixty-four channels (DQ), this option even supports devices with multiple DDR2 memory interface ports. |
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Compatible with T6500 Series
In addition to ensuring both hardware and software compatibility with the T6500 series, the T6577 offers improved test coverage and throughput. |
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| Major Specifications |
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| Target Devices: |
Standard Logic, Digital ASIC and SoC devices for consumer electronic products |
Number of Logic I/O
Device Pins: |
1024 channels |
| Test Speed: |
125MHz / 250MHz / 500MHz (data rate) |
| Simultaneous Testing: |
Up to 32 devices (supported with OS)
Flexible parallel testing available |
| Pattern Generator: |
64MW |
| DR/CP Level: |
-2V to +8V |
| DPS: |
8V, 2A x up to 32 channels
40V, 80mA x up to 8 channels
TOTAL: up to 32 channels |
| DC Test: |
PPDC: up to 1024 channels
MDC: up to 64 channels
UDC: up to 8 channels |
| Mixed-signal Options: |
VAFG: 16bits/51.2Msps, up to 8 channels
VAFD: 16bits/750Ksps, 14bits/51.2Msps,
up to 8 channels
BBWG: 16bit/400Msps, 4 channels
BBWD: 16bit/128Msps (256Msps), 4channels |
| Other Options: |
AFM, ALPG, SCPG, HSCLK, IDDQ, HCDPS, SG/JMM, DDR2 IF Option |
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