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3D Imaging Analysis System
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Electronic Measuring Instruments
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Test Systems for high-volume
production test achieve high-throughput
and reduce operating costs with
a compact, floor saving design
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With high density,
ultra-compact designs, these test
systems achieve high throughput
and reduced cost. However, the
T6500 series does not cut back
on performance. These systems
are virtually 100% functionality
and feature compatible with T6683,
T6673 and T6672 systems.
The T6500 series offer a low entry
cost via the T6533 and an easy
upgrade path to the T6573. |
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T6500 systems are test fixture,
test program, docking (handler/prober) compatible
with all T6000 series testers.
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T6573 |
T6563 |
T6533 |
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Target Devices: |
High-speed
MPU, ASIC, SoC |
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Test Speed: |
125/250/
500MHz
(data rate) |
62.5/125/
250MHz
(data rate) |
31.25/62.5/
125MHz
(data rate) |
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Pin Configurations: |
Up to 512 I/O
(max) |
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Simultaneous
Testing: |
Up to 8 devices |
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