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3D Imaging Analysis System
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Electronic Measuring Instruments
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High-speed testing of high-definition LCD driver chips
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LCD driver IC's have rapidly developed in the areas of high definition, more pins, high-speed data transfer and other technological innovations. The T6371/6361 LCD driver test system precisely tests such IC's.
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Simultaneous testing of IC's with many pins
By increasing analog pins up to 1280, or digital pins up to 256, the T6371/6361 achieves simultaneous testing of up to 4 devices. And, it achieves extremely high throughput compared with our traditional models. Further, the T6371/6361 reduces test cost with high throughput by adapting newly developed technologies.
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High throughput by new technologies
The T6371/6361 eliminates the time lost for block exchange by adopting the "per pin" method for its LCD comparator. Also, it achieves high-speed testing of IC output deviation by incorporating a multi-channel digitizer and high-speed acquisition memories.
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High-speed function testing
ADVANTEST's superior logic testing technology created T6371, which performs high-speed functional testing at frequencies up to 250 MHz. Further, since T6371/6361 incorporates a Viewpoint LCD, the testing, evaluation and analysis can be easily performed at high speed in the same environment as T6600 series models.
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| Major Specifications |
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| Target devices: |
LCD driver IC's, MCU, MPU, etc. |
| Simultaneous testing: |
Up to 4 devices |
LCD measurement section
Pin configuration:
Comparator:
Digitizer: |
Up to 1280 pins
A "per pin" comparator
Up to 160 channels |
Reference voltage source
Number of channels: |
Up to 64 channels |
Digital section
Test speed:
Pin configuration: |
T6371; up to 125/250 MHz
T6361; up to 62.5/125 MHz
Up to 256 pins |
| Software: |
Viewpoint LCD |
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