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Terahertz Spectroscopic / Imaging Analysis System
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Electronic Measuring Instruments
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A High-Throughput Tester Optimal for Mass-production of High-speed Devices such as DDR2-SDRAMs
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As cell phones and notebook
PCs become more compact and yet incorporate ever more enhanced functionality,
memory devices have correspondingly increased in speed and in storage capacity.
Meanwhile, volume-production solutions that deliver lower overall cost-of-test for
testing high-speed devices such as DDR2-SDRAMs are in increased demand.
The T5588 meets such market demands with a maximum testing rate of 800 Mbps and
by allowing the simultaneous testing of up to 512 devices. This enables high throughput
testing at greatly reduced costs. T5588 is also the first DRAM package tester to offer
an optional flash memory test function, making it uniquely adaptable to changing market
conditions.
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Simultaneous Testing of Up
to 512 Devices
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| The optimum number of pins for testing DDR2-SDRAMs
has been mounted on the T5588 to help it achieve simultaneous testing of up to 512 devices. |
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Low Cost and Reduced Footprint
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| Owing to an original ASIC
design developed using a cutting-edge CMOS process, the T5588 is able to cut costs
by approximately 40%, compared with our conventional model, and has a reduced footprint. |
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The Multi-language
Operating System
FutureSuite®
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Use of the multi-language operating system FutureSuite
allows programming in the worldwide standard, C and ATL languages.
*FutureSuite is registered trademark in Japan, US and other countries licensed by ADVANTEST corporation. |
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| Major Specifications |
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| Target Devices |
DDR2-SDRAMs, FLASH memories |
| Simultaneous Testing |
Up to 512 devices per system |
| Test Speed |
400MHz/800Mbps |
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