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Terahertz Spectroscopic / Imaging Analysis System
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Electronic Measuring Instruments
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Digital Consumer Solution
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| High-performance, low-cost SoC test solution optimized for high-volume manufacturing of today's complex consumer devices |
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Drastic reductions in cost-of-test
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| Offering increased parallelism and high-speed digital and analog modules, the T2000 test system provides dramatic reductions in cost-of-test which is critical for digital consumer market with: |
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A new compact ATE footprint (LSMF) |
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A new digital module (800MDM) which offers high density (128 channels) and low cost |
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Two new analog modules (AAWGD, BBWGD) with 2x the channel counts of alternative solutions |
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A new DC test solution (PMU32), which provides 32 high accuracy channels per module, for ADC/DAC and other DC test challenges |
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* Based on ADVANTEST COST model |
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| Combining these and other features enables twice the throughput and half the cost-of-test. |
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State-of-the-art, feature-rich capabilities
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| The T2000 test system responds to the needs of the digital consumer market's ever-increasing demand for product versatility and sophisticated functionality with: |
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Multi Time Domain functionality for testing multiple frequency domains simultaneously |
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Analog modules (AAWGD, BBWGD) providing full-spec test, providing coverage from high-performance audio to video and baseband |
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PMU32 module capable handling a broad spectrum of precision test including ADC/DAC linearity |
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6.5GDM for supporting test of HDMI, SATA, and other high-speed interfaces |
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800MDM which provides measurement functionality necessary to validate source-synchronous interfaces, such as for DDR2 |
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| Combined with newly developed test modules and LSMF, T2000 provides optimized test solution for fast growing consumer devices. |
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| Analog modules provide broad coverage |
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Digital Consumer Solution
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| Various modules for your digital consumer device testing: |
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| 6.5GDM |
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6.5Gbps |
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Differential 8I + 8O per Module |
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Header Hunt Function for Non-deterministic Latency |
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Clock Data Recovery for Embedded Clock Interfaces |
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Clock Tracking Mode for Source Synchronous Interfaces |
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| 800MDM |
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128 I/O pins per Module |
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SCAN Test Function |
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Memory Test Function |
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High Voltage Digital Pin |
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Source Synchronous Tests |
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Multi Time Domain |
| 800Mbps License |
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 200/400/800Mbps |
| 500Mbps License |
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125/250/500Mbps |
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| AAWGD for Audio |
| Audio AWG |
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8 AWG ch per Module
(4 L/R pair) |
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24bit/200Ksps |
| Audio DGT |
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8 DGT ch per Module
(4 L/R pair) |
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18bit/820Ksps (20bit/51Ksps) |
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| BBWGD for BaseBand, Video |
| BaseBand AWG |
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8 AWG ch per Module
(4 I/Q pair) |
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16bit/400Msps |
| BaseBand DGT |
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8 DGT ch per Module
(4 I/Q pair) |
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16bit/128Msps |
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Hardware DSP Engine |
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| PMU32 for ADC/DAC |
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32 DC pins per Module |
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High Speed DC Linearity Test |
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Wide Coverage of Voltage Range (±0.7V to ±40V) |
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| Device Power Supply |
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| LCDPS |
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8ch per Module |
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4A Maximum Output |
| DPS500mA |
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32ch per Module |
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500mA Maximum Output |
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LSMF |
Test Head Slots: 26 slots
MF Size: 800(W) x 1050(D) x 1600(H)mm
Maximum Site Controller Count: 4 |
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