 |
|
Terahertz Spectroscopic / Imaging Analysis System
|
|
|
|
Electronic Measuring Instruments
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
CMOS Image Sensor Test Solution
|
|
|
|
|
|
| New, high-parallel test solution incorporates highspeed interface technology to enable evaluation and production test of advanced CMOS image sensors. |
|
|
Flexible support for multifunction image sensors
|
|
| CMOS image sensors are now incorporating functions such as AD/DA and other SoC circuits. T2000 modular architecture enables testing of these complex devices by configuring the tester with optimal instrument configurations to meet the test requirements at the lowest cost of test. |
| |
1.2Gbps high-speed image capture
|
|
| The module's high-speed image-capture interface supports a variety of CMOS image sensors including mobile, DSC, DSLR, CAM, and industrial CIS. In addition, the large dual bank capture memory enables simultaneous data storage and data transfer to the image processing engine, minimizing test times significantly. |
|
 |
Differential input:
Serial data: 1.2Gbps, 4 lanes x 4 channel
Parallel data: 200M pixels/s, 16 bits x 4 channel |
|
|
Large capture memory: 128M pixels x 2 banks
Capable of storing continuous image data of up to 255 frames |
|
Parallel testing up to 64 devices
|
|
|
|
|
The module's ultra high-volume simultaneous measurement capability enables uniquely high productivity and a significant cost savings for image sensor testing. And, most importantly, the system's optimized, and uniform light source and large user area enables 64-parallel testing of ultra-high-density and quality, as well as high-performance devices.。
|
440mm probe card and 2048ch Frog Unit (pogo interface)
User area: 252 x 208mm
Large exposure area: 160 x 150mm |
|
|
 |
|
T2000 module configuration for CMOS image sensor testing
|
|
|
| 800MDM (800/500Mbps) |
|
128 I/O pins per module |
|
SCAN Test Function |
|
Memory Test Function |
|
High Voltage Digital Pin |
|
Source Synchronous Tests |
|
Multi Time Domain |
|
|
| 1.2GICAP (1.2Gbps) |
|
Serial Input |
| |
Data Rate: 1.2Gbps
Data: 4 port x 4ch, Clock: 1 port x 4ch |
|
Parallel Input |
| |
Data Rate: 200M pixel/s
Data: 16bit x 4ch,
Clock: 1bit x 4ch
Trigger: 1bit x 4ch |
|
Capture Memory |
| |
Memory Capacity: 128M pixel/bank
Memory Bank: 2 bank/ch |
|
|
|
 |
| |
| PMU32 for ADC/DAC |
|
32 DC pins per module |
|
High Speed DC Linearity Test |
|
Wide Coverage of Voltage |
| |
Range (±0.7V to ±40V) |
|
200mA Maximum Output |
|
|
| DPS500mA |
|
32 DC per module |
|
500mA Maximum Output |
|
|
|
| LSMF+EXMFIS |
 |
Test Head Slots : 46 slots
| MF Size: |
800(W) x 1050(D) x 1600(H)mm
+1100(W) x 1050(D) x 1600(H)mm |
|
| |
| |
|
