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Terahertz Spectroscopic / Imaging Analysis System
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Electronic Measuring Instruments
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A High-speed and Stable Test Handler capable of Simultaneously Testing up to 256 Devices
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As cell phones and notebook PCs become more compact and yet incorporate ever more enhanced functionality,
memory devices have correspondingly increased in speed and in storage capacity.
Furthermore, the demand for stacked devices, such as DRAM + flash devices and
multi-chip packages (MCPs), has skyrocketed due to the diversification of the end-market usage.
The M6300 offers a high-speed and flexible testing environment for these complex and variable
devices, by incorporating a range of innovations including high-speed handling technology and a newly-developed
contact mechanism.
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High Throughput Cuts Testing Costs
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The M6300 greatly reduces costs due to its high-speed handling of up to 12,000 devices/hour (approx. 1.9 times faster than conventional
models).
When combined with T5588/5587, this handler affords greater reductions in testing costs, offering the industry’s most cost efficient,
high-throughput total testing solution. |
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Stable Operation Ensured by Precision Contact
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A newly developed contact force control mechanism utilizes air-pressure control to effectively minimize failures
by enabling the system to delicately adjust both contact pressure and speed, when handling smaller, thinner and
lighter devices such as CSPs. |
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Quick and Smooth Device Changing
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This new contact mechanism also allows the customer to adjust for different device types quickly and smoothly,
as no change to the load management component is required.
In addition, a reduction in the number of change-kit parts allows for significant savings in both costs and labor required for
implementing device-change kits. |
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| Major Specifications |
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| Target Packages |
BGAs, CSPs, TSOP1s, TSOP2s |
| Simultaneous Testing |
Up to 256 devices |
| Throughput |
12,000 devices per hour |
| Temperature Range |
-30 to +125 , -55 to +125 (optional) |
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