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Terahertz Spectroscopic / Imaging Analysis System
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Electronic Measuring Instruments
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Comprehensive Testing of Consumer Devices is now a Reality
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Today's consumer devices are designed and manufactured for incorporation into a variety of electronic products, and must perform to specification even when used under changeable environments. They must also be capable of maintaining their integrity when stress-tested under conditions equivalent to those faced in actual applications. ADVANTEST's new T6575A SoC test system addresses these challenges, while enabling easy, yet comprehensive, test of devices with high voltage or other similarly demanding specifications.
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High-voltage driver and high-voltage power supply options
As with the T6575, the T6575A represents a dramatic increase in power, with respect to the driver voltages associated with ADVANTEST's T6500 product series. This new level of performance affords greater stress test capabilities, leading to more reliable and accurate results. Furthermore, with the addition of the high-voltage power supply option, fuse verification and high-voltage test capability are now supported. |
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Full compatibility with the T6575
The T6575A is fully compatible with the T6575. In addition to its maximum 32-device OS parallel test, it also boasts extended functionality, including: 16-device parallel test including match, high-speed Fixed Delay Match, and DFM capacity. These features allow the user to effectively share test resources at hand. |
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Pressing Forward with a Single Platform
With the adoption of ViewPoint® software, which already enjoys a solid reputation for working with SoC test systems, we have achieved an even greater ability to work on a single platform. Thus, from design and development, to the volume production line, the product delivers both stability of operation and ease of use. |
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| Major Specifications |
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| Target Devices: |
MCU, ASIC, etc. |
| Test Speed: |
T6575A: 125 MHz/250 MHz/500 Mbps
T6565A: 62.5 MHz/125 MHz/250 Mbps
T6535A: 31.25 MHz/62.5 MHz/125 Mbps |
| Simultaneous Testing: |
Up to 32 DUTs
(OS parallel test, odd device counts supported)
Up to 16 DUTs (including match) |
| Pin Configuration: |
512 I/O pins (maximum) per station |
Programmable
Power Supply: |
DPS 32 ch (maximum)
40 Vpps option 8 ch (maximum) |
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