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Terahertz Spectroscopic / Imaging Analysis System
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Electronic Measuring Instruments
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Parallel Test for up to 512 NAND Flash Memory Devices
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| T5761 |
T5761ES |
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| Demand for NAND flash memory continues to rise dramatically, propelled by an insatiable demand for consumer gadgetry, including computerized devices, cellular telephones, portable music players, digital video appliances, and car navigation systems. And, the geometric bit growth and multi level cell technology in data flash drives longer test times while the consumer market drives a commodity price point, demanding further reductions in the overall cost of test. The T5761 memory test system answers these calls with significant reductions in test time, and with its 512-device parallel test capability, per-site architecture, Error Code Correction (ECC), and real-time test programming functionality, the system also affords greatly reduced test costs. |
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Improving throughput with 512-device parallel test and ECC
With its per-site architecture, which allows testing of 2 DUTs NAND flash memories in parallel within a site, the T5761 provides the capability to parallel-test up to 512 devices. As a result, test can be performed independently for each device, and at a high rate of throughput. This model's support for ECC, a device feature previously difficult to support without significant test time impact , provides for shorter test times, along with significantly improved yields. Real time ECC support is a must for the shrinking geometry and bit density of newer NAND Flash.. |
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A compact engineering station
The T5761ES (Engineering Station) brings cost reduction capabilities to test program development and evaluation of small quantities of devices.
The T5761ES offers the performance and functionality of the T5761, but within a compact form factor. With this engineering station, device evaluation and the deployment of test programs into volume-production is now simplified. |
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Using FutureSuite®, with multi-language support
FutureSuite allows program development and evaluation/analysis making maximal use of per-site architecture. It delivers full coverage extending from the design stage through volume production. Also, FutureSuite, with its multi-language support, enables the user to program either in the C-based MCI (Macro Control Interface) language or in ATL, providing a compatible syntax to the industry's most common memory platforms. |
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| Major Specifications |
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| Model Number: |
T5761 |
T5761ES |
| Target Devices: |
FLASH memory, EPROM, etc. |
| Simultaneous Testing: |
Up to 512 devices |
Up to 16 devices |
| Test speed: |
66 MHz |
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| FutureSuite is registered trademark in Japan, US and other countries licensed by ADVANTEST CORPORATION. |
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