ADVANTEST

ADVANTEST

Japan

ABOUT ADVANTESTINVESTORSPRODUCTS & SUPPORTNEWSENVIRONMENTCAREERS
HOME


Press Release FY2011


Press Release FY2010


Press Release FY2009


Press Release FY2008


Press Release FY2007

Advantest's Integrated SoC Tester/Handler Test Cell Wins
2008 Best in Test Award

January 30, 2008
2008 The Best in Test
TOKYO, Japan, January 30, 2008 - Advantest Corporation (TSE: 6857, NYSE: ATE) announces that its integrated T2000 LS Mainframe(T2000 LS MF) and M4841 Dynamic Test Handler - the company's high-performance SoC Test Cell- has won a 2008 Best in Test Award.
Introduced at Semicon West 2007, Advantest's T2000 LS MF/M4841 Test Cell was selected by the editors of Test & Measurement World magazine, as a Best in Test product for its innovation and contribution to the field of electronics test, measurement and inspection.

High-Volume Capability in a Unique Configuration
Advantest is the only ATE company that has for decades designed and manufactured its own handlers and interfaces in addition to its test systems and software, and is uniquely qualified to tightly integrate and optimize the entire test cell. Advantest's SoC test cell solution is unique for its single-vendor tester-handler integration, bringing highly parallel, high-performance turn-key testing capabilities to SoC consumer device manufacturing.

This singular SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour. The T2000's OpenStar®--compliant architecture offers ultimate scalability and flexibility and the test system's proprietary liquid-cooling design enables high-performance of the 26-slot test head, which accommodates instrument modules for a variety of testing: RF, audio, baseband, and data-conversion.

The M4841 is also designed for maximum flexibility and high performance. It handles a variety of packages, has extremely high throughput and reliability, and features proprietary innovations such as Advantest's Soft Touch technology, which uses an electro-pneumatic air-pressure technique to avoid damaging extremely miniaturized parts during touchdown.

OPENSTAR® is a registered trademark of the Semiconductor Test Consortium, Inc. in the United States, Japan and other countries.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.

About Advantest
Advantest Corporation is the world’s leading automatic test equipment supplier to the semiconductor industry, and also produces electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor production lines in the world. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has 40 subsidiaries worldwide. Among them, Advantest America, Inc. is based in Santa Clara, CA., and Advantest (Europe) GmBH is based in Munich, Germany. More information is available at www.advantest.co.jp.
Index of Press Release 2007
Legal | Privacy Policy | Sitemap | Contact | © Copyright 2012 ADVANTEST CORPORATION