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Advantest Showcases Total Test Solutions
at SEMICON Japan 2007
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TOKYO, Japan, November 30, 2007 - Advantest Corporation (TSE: 6857, NYSE: ATE), the world's largest provider of test equipment to the global semiconductor industry, will exhibit at SEMICON Japan 2007, December 5-7, at Chiba's Makuhari Messe.
Advantest's booth will exhibit a comprehensive range of leading-edge test solutions, all of which characterize the company's slogan for the event: "AT the Core of Testing". |
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| Exposition Dates |
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Wednesday December 5 ~ Friday December 7 |
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| Venue |
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Makuhari Messe, Chiba, Japan |
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| Booth |
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International Exhibition Hall 10, 10C-801 |
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T2000 Test System |
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High-Speed I/F Solution |
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This total test solution incorporates testing functions for high-speed, multi-channel device interfaces. |
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High-Parallelism Solution  |
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A high-density digital module increases tester channels to more than 2000, enabling parallel testing of highly functional devices and reducing cost. |
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Test Cell Solution |
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This one-stop solution, covering needs ranging from testing to handling, enhances test performance greatly. The M4841 dynamic test handler offers a high-throughput, 16-device parallel test solution for MCUs and DSPs. |
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RF Solution |
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Provides 32 ports per module, enabling low-cost testing of multi-port RF devices on the T2000 test system. |
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Engineering Solution |
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A test solution optimized for engineering needs and high-mix, low-volume production. EDA engineering software offers a software solution for nanometer SoC test, reducing turn-around time and improving yield. |
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LCD Driver Solution |
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T6373 LCD Driver Test System |
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Low-cost testing of a wide range of functions on next-generation, high-definition LCD drivers. |
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Flash Total Solutions |
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T5781 Memory Test System |
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Offers industry's highest test speeds of 266MHz/533Mbps for MCPs, and testing of DRAM, flash memory and MCPs on a single system. |
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T5781ES Memory Test System |
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The T5781 Engineering Station condenses all the functionality of the T5781 into a more compact model. |
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T5761 Memory Test System |
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With 512-device parallel test of NAND flash memory, this system is one the industry's best performers in mass production. |
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T5761ES Memory Test System |
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With all the performance qualities of the T5761, this compact version facilitates design and development. |
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M6241 Dynamic Test Handler |
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Offers high-speed handling for high throughput and enables high parallelism for reduced cost. |
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Burn-in Test Solution |
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P3502 Test Burn-in System |
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An asset to memory device mass production processes, reducing cost and improving throughput. |
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EB Lithography Solution |
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F3000 Electron Beam Lithography System |
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Maskless system with capacity to deal with miniaturization to the 65nm node level and smaller |
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Enquiries should be directed to the Sales Promotion Department at
81-3-3214-7500 |
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| Note: |
All information supplied in this release is correct at the time of publication, but may be subject to change without warning. |
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Advantest Corporation is the world’s leading automatic test equipment supplier to the semiconductor industry, and also produces electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor production lines in the world. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has 40 subsidiaries worldwide. Among them, Advantest America, Inc. is based in Santa Clara, CA., and Advantest (Europe) GmBH is based in Munich, Germany. More information is available at www.advantest.co.jp. |
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