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Advantest Introduces Highly Accurate 2Gbps Test Solution for Source-Synchronous Bi-Directional Interfaces; Broadens Range of Solutions for Open-architecture T2000 Test Platform
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36-channels, zero round trip, and new multi-strobe technology provide fast, accurate testing of DDR2/DDR3 interfaces with excellent ROI
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TOKYO, Japan, October 22nd, 2007 - Advantest Corporation (TSE: 6857, NYSE: ATE), today announced its new 2Gbps Source-Synchronous * Interface test solution, which offers high-accuracy testing for source-synchronous interfaces such as DDR2/DDR3 which are found in most CPUs and memory chipsets. The product will be available from January 2008.
Advantest's new 2Gbps Digital Module (2GDM) test solution, a complete functional/AC/DC test solution for the company's T2000 open-architecture test system, features very high performance at low cost. Patented Advantest multi-strobe capabilities significantly speed timing margin testing providing for single pass testing of most source-synchronous and timing parameters. The new module addresses the industry's need for an SoC tester that can perform high-throughput at-speed functional test on source-synchronous interfaces.
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The device transmitting data also constantly outputs the standard clock signals simultaneously, thereby achieving highly accurate timing of data reception. |
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Meets Changing Market and Technology Needs
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Growing market demand for multimedia (video, music, online games) personal computers means that CPU and memory data processing capacity of semiconductors must also become more advanced. Particularly in the memory field, because of Microsoft's recently introduced Windows Vista®, a shift is expected from DDR2 to DDR3, the latest generation offering fast processing speeds and larger capacity. This technology requires source-synchronous interfaces, which enable high-speed data transfer between the CPU and memory devices. Testing these interfaces on traditional SoC test systems carries significant added test costs, because without the FlyBy comparators available on the 2GDM, two tester channels are required per DUT pin. Additionally, confirming the timing margins on these source-synchronous interfaces requires that the tester pin-electronics track the DUT output clock and perform timing measurements relative to its timing. The 2GDM is unique in the industry as it performs this task within a single test pass, using patented Advantest technology.
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New Product Meets New Needs for Performance,
As Well As for Cost
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The new 2GDM enables full functional testing of high-speed source-synchronous interfaces up to a speed of 2Gbps on the T2000 OPENSTAR® standard-based test platform, with high accuracy and at low cost.
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The industry's first testing solution to support source-synchronous testing with the use of multi-strobe technology. Advantest's patented multi-strobe, which enables real-time testing of high-speed source-synchronous interfaces, dramatically simplifies test setup and reduces device test time. |
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The 2GDM supports test speeds up to 2Gbps to keep pace with high-speed data transfer requirements for DDR2/DDR3 interface testing. |
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Each of the 36 channels on the 2GDM provides a secondary compare channel which allows the module to test bi-directional I/O busses with a zero round-trip delay. This effectively nullifies the impact of the signal delays through the interconnect and performance board. An integrated zero round-trip solution provides the user a simpler test setup environment as well as much lower cost. |
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l It expands the range of tests that can be performed on a single test system, Advantest's T2000, extending and enhancing ROI. The 2GDM not only enables real-time testing of high-speed source-synchronous interfaces on an SoC test system, but it expands the capabilities of the T2000 non-propriety test platform. |
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The new module is part of a suite of SoC test solutions for Advantest's T2000, which also includes higher speeds (up to 6.5Gbps), higher density (up to 128 cost effective channels per module), higher power, mixed signal, and RF testing capabilities. The 2GDM adds cost effective testing of bi-directional source-synchronous interfaces to the offerings.
Advantest is committed to expanding its range of test solutions on the T2000 test system in order to meet a variety of testing needs, thereby helping its customers enhance their competitive power in the market.
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Windows® and Windows Vista® are registered trademarks or trademarks of Microsoft Corporation in the United States and other countries. |
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OPENSTAR® is a registered trademark of the Semiconductor Test Consortium, Inc. in the United States, Japan and other countries. |
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FlyBy is a registered trademark of Advantest Corporation in the United States, Japan and other countries. |
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2Gbps Digital Module |
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Test Speed |
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2Gbps |
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Pin Count |
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36 channels/module |
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Pattern Memory |
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256M vector memory (maximum)
With SCAN/memory test capability |
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Enquiries about this product should be directed to:
ATE Solution Business Division, Sales Group at 81-3-3214-7505 |
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All information supplied in this release is correct at the time of publication, but may be subject to change without warning. |
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Advantest Corporation is the world’s leading automatic test equipment supplier to the semiconductor industry, and also produces electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor production lines in the world. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has 40 subsidiaries worldwide. Among them, Advantest America, Inc. is based in Santa Clara, CA., and Advantest (Europe) GmBH is based in Munich, Germany. More information is available at www.advantest.co.jp. |
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