|
|
 |
|
|
|
|
|
|
|
|
|
|
Advantest Introduces New Low-Cost Consumer Device SoC Test Solution for T2000 Open-Architecture Test Platform
|
|
|
|
|
|
|
|
|
TOKYO, Japan, December 5, 2006 - Advantest Corporation (TSE: 6857, NYSE: ATE), today introduced a new low-cost OPENSTAR -compliant test solution for the T2000, specifically designed with the compactness and modularity required to effectively test today's high-functionality SoC consumer devices. The T2000's new LS mainframe will be exhibited during SEMICON Japan, December 6-8, at Chiba's Makuhari Messe. The new test solution which dramatically lowers test costs will be available from June 2007.
Worldwide growth in demand for consumer electronics such as DVD players and portable televisions is predicted to continue, with intensifying competition among manufacturers forcing prices downward. This in turn is forcing down the prices of the semiconductors that drive these products, despite their increased functionality and complexity. In response to these market pressures, chip makers continually strive to lower test costs and also to find a means for eliminating the need for purchasing new test systems that meet the changing demands of the devices that drive the latest cutting-edge electronics.
Advantest's new low-cost test solution for consumer devices is comprised of modules that fit within the test head of the newly developed LS mainframe which is based on the T2000 open-architecture test platform. This new test solution offers high-speed digital test and analog test capability, both with enhanced parallel test capacity. Ideal for today's high-functionality SoC consumer devices, the new solution delivers 50% greater test cost reduction and twice the parallel test capability previously available. At the same time, the new LS mainframe boasts a space-saving design that requires less floor space. Test modules are easily interchangeable to suit the type of device under test, allowing customers to employ an optimal configuration for their needs while reducing cost-of-test.
These new module introductions testify to Advantest's R&D strengths. For high-performance SoC consumer devices Advantest now offers an 800Mbps digital module and a 500Mbps digital module, each with 128 channels - four times greater than previously available. High-density integration techniques have enabled this greater number of channels per module. Both modules have memory test functionality and capability to test high-function SoC devices with embedded memory. They can also be implemented for DFT using a SCAN test capability.
And, in recognition of the increasing range of consumer electronics applications for SoC devices, the newly developed analog test modules include the AAWGD, which supports audio frequency test, and the PMU32, which offers low-cost, high-accuracy test of ADC/DAC linearity. Each module sets a new standard of performance in analog test.
All of these new modules contribute to reducing test costs, owing to their high number of channels, which allows customers to achieve twice the parallel test capacity with fewer than half the previously required number of modules.
Based on the OPENSTAR open-architecture specifications, the T2000 test system offers flexibility and adaptability unmatched in the industry. Instead of investing in new testers for each new line of products, customers may construct a test system optimally configured to their specific needs, using mainframes, test heads, and modules developed to the common standard promoted by the Semiconductor Test Consortium. The launch of its new consumer electronics test solution based on the LS mainframe heralds Advantest's planned release of further OPENSTAR -compliant products - an integral element of the company's commitment to helping its customers to enhance their competitiveness with test solutions tailored to changing market needs.
OPENSTAR is a registered trademark of the Semiconductor Test Consortium, Inc.
|
|
|
|
|
|
|
 |
LS Mainframe |
|
|
Voltage : |
|
AC 200V, maximum 2 lines |
|
|
Body Size : |
|
1050mm (D) x 800mm (W) x 1600mm (H) |
|
|
Testing Processor : |
|
maximum 4 processors |
|
|
800Mbps Digital Module |
|
|
Test Speed : |
|
200 / 400 / 800 Mbps |
|
|
Pin Count : |
|
128 channels / modules |
|
|
Pattern Memory : |
|
128M vector memory (maximum)
With SCAN / memory test capability |
|
|
500Mbps Digital Module |
|
|
Test Speed : |
|
125 / 250 / 500 Mbps |
|
|
Pin Count : |
|
128 channels / modules |
|
|
Pattern Memory : |
|
128M vector memory (maximum)
With SCAN / memory test capability |
|
|
|
|
Enquiries about this product should be directed to:
ATE Solution Business Department at 81-3-3214-7505 |
|
|
|
| Note: |
All information supplied in this release is correct at the time of publication, but may be subject to change without warning. |
|
|
|
Advantest Corporation is the world’s leading automatic test equipment supplier to the semiconductor industry, and also produces electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor production lines in the world. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has 40 subsidiaries worldwide. Among them, Advantest America, Inc. is based in Santa Clara, CA., and Advantest (Europe) GmBH is based in Munich, Germany. More information is available at www.advantest.co.jp. |
|
|
