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Advantest Launches New T5761/T5761ES Memory Test System
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512-Device Parallel Test Capacity
High Throughput for Wafer and Package Level NAND Testing
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T5761ES |
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TOKYO, Japan, November 2, 2006 - Advantest Corporation (TSE: 6857, NYSE: ATE), today announced that its new memory test system, the T5761/T5761ES, for NAND flash memory wafer test and package test, will be available on December 1st.
The company will exhibit the new solution during SEMICON Japan, December 6-8, at Chiba's Makuhari Messe.
Growth in consumer electronics such as cellular phones, digital cameras, and MP3 players continues to accelerate demand for NAND flash memory, and the market is forecast to expand further as NAND applications evolve to include storage media such as hard disks for personal computers. However, while device bit density grows rapidly, and devices become faster and more reliable, cost-per-bit is plummeting. Semiconductor equipment manufacturers are being called upon to provide efficient, low-cost test solutions that can enhance throughput and yield.
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Ideal Solution for Cost-Efficient NAND Development and Production
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Advantest's new T5761/T5761ES test system utilizes tester-per-site architecture, the optimal choice for flash memory test, to maximize efficiency at every stage of NAND test from wafer test to package test. With a 512-device parallel test capacity - twice that of the company's previous model - the new system delivers dramatically higher throughput. It also boasts a new error correction function (ECC) specially developed for NAND devices, thus improving yield. In addition, a real-time counter calculates the number of fail bits while the tester is in operation, and its upgraded NAND flash memory block management ability allows it to skip unneeded blocks without testing them, contributing to reduced test times. Though equipped with added functionality, the T5761/T5761ES is offered at a price equivalent to or less than that of its predecessor. With its low cost, added functionality and industry-leading utilization, the T5761/T5761ES provides flash memory producers with an optimal manufacturing solution.
The T5761ES (Engineering Solution) shares all the functionality and performance of the T5761, but it has been specially designed to simplify low-volume device evaluation and facilitate the development of test programs for high-volume production. Both models offer unique advantages for NAND flash memory testing needs from engineering through production.
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T5761 |
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Parallel Test Capacity: |
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max. 512 devices |
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Maximum Test Speed: |
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66MHz |
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Test Head: |
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1 station |
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T5761ES |
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Parallel Test Capacity: |
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max. 16 devices |
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Maximum Test Speed: |
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66MHz |
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Test Head: |
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1 station |
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Enquiries about this product should be directed to:
ATE Solution Business Department at 81-3-3214-7505 |
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All information supplied in this release is correct at the time of publication, but may be subject to change without warning. |
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Advantest Corporation is the world’s leading automatic test equipment supplier to the semiconductor industry, and also produces electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor production lines in the world. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has 40 subsidiaries worldwide. Among them, Advantest America, Inc. is based in Santa Clara, CA., and Advantest (Europe) GmBH is based in Munich, Germany. More information is available at www.advantest.co.jp. |
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