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Advantest Launches New M4543A Dynamic Test Handler
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New Handler Delivers High Throughput, Individual DUT Thermal Control
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TOKYO, Japan, November 24, 2005 - Advantest Corporation (TSE: 6857, NYSE: ATE), the world's largest provider of test equipment to the global semiconductor industry and a leading supplier of system-on-chip (SoC) test systems, today announced that its new dynamic test handler, the M4543A, will be available from December 1st. Capable of parallel testing up to four devices, and boasting individualized thermal controls, the M4543A addresses the trend towards higher integration, higher speed, and correspondingly greater thermal output from CPUs and MPUs.
The company will exhibit the handler during SEMICON Japan, December 7-9, at Chiba's Makuhari Messe.
Mass market consumer electronics are making giant strides in speed and performance, as the processing power of the chips that drive them increases exponentially. However, faster chips consume more power, and dissipate more heat as a result. To ensure optimal functionality in their end-use applications, these devices must be tested at design-specified temperatures, but individual devices often generate more or less heat, leading to reduced yields. There is also the risk that devices may overheat and fail during the test process. Meanwhile, the rapid adoption by the market of devices with advanced functionality has intensified price competition among semiconductor manufacturers, spurring calls for further reductions to cost of test. With this background, yield and throughput improvement are of great concern to manufacturers.
The new M4543A dynamic test handler is equipped with independent sensors that allow it to measure the surface temperature of each device and apply individual thermal controls. In its optional configuration, the handler is further able to measure and precisely control the thermal diodes within each device's circuitry. Even when testing four devices in parallel, it can keep each one at the temperature specified in the test parameters, thus improving the accuracy of the test process and increasing yield. Moreover, superior rigidity enhances quality of contact between the tester and device pins, while the M4543A's pressure control mechanism is twice as powerful as that of the system's predecessor, minimizing contact failures even when testing devices of more than 1000 pins.
The M4543A boasts independently rotating pickup arms for placing DUTs on the test board. Devices placed in the tray may be given any orientation on the test board, so that test board designs may be optimized to the layout of tester pins, allowing designers more flexibility. Moreover, configuration options include an extension stocker and a heat plate for high-temperature test, enabling customers to adjust the system to their specific needs. |
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Advantest Corporation is the world’s leading automatic test equipment supplier to the semiconductor industry, and also produces electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor production lines in the world. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has 40 subsidiaries worldwide. Among them, Advantest America, Inc. is based in Santa Clara, CA., and Advantest (Europe) GmBH is based in Munich, Germany. More information is available at www.advantest.co.jp. |
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