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Index of Press Release 2012
Advantest Enters MEMS Testing Market with Multiple System Installations at Freescale(R) Semiconductor's Facilities in Arizona and Asia
March 27, 2013
Advantest VOICE 2013 Conference to Feature High Quality Presentations for SOC Platforms and Handlers
February 14, 2013
Advantest Expands Application Coverage of TAS7500 Series of Spectroscopic Imaging Systems with 2 New Systems; Transmittance Polarization Analysis Module Also Developed
February 4, 2013
Advantest's New Test Cell Selected By Marvell semiconductor to Reduce Cost of Test for High-volume, Cost-sensitive ICs
January 8, 2013
2013 New Year Address from President Haruo Matsuno (abridged)
January 4, 2013
Advantest Introduces New T2000 3Gbps CMOS Image Capture Module for Industry-Leading T2000 ISS Semiconductor Test Platform
November 29, 2012
Advantest Introduces T2000 8-Gbps Digital Module for High-Speed Testing of SoCs with Serial, Parallel or Memory Interfaces
November 27, 2012
Advantest Develops EB Lithography System for 1Xnm Node F7000
November 14, 2012
Advantest Develops Mask Defect Review SEM E5610
November 14, 2012
Advantest Introduces New Wafer MVM-SEM Tool E3310
November 14, 2012
Advantest Introduces T2000 IMS for Low-Cost Testing of Integrated Microcontroller and Smart Card ICs
November 7, 2012
Advantest Establishes Princeton Facility to Support Sales of TAS7500 Terahertz Spectroscopic/Imaging Analysis System
October 10, 2012
Advantest Establishes New Subsidiary Cloud Testing Service, Inc.
October 1, 2012
Corporate Social Responsibility Report 2012 Now Available
September 13, 2012
Advantest Develops THz TOF Tomography Analysis System
September 3, 2012
Advantest's Terahertz Spectroscopic/Imaging System TAS7500 Adopted by Astellas Pharma Inc.
August 30, 2012
Advantest Ships 500th V93000 Port Scale RF Tester to Chinese Producer of Wireless Communication ICs
July 27, 2012
Advantest Wins Best Supplier Award from STATS ChipPAC
July 27, 2012
Advantest and JEM Receive Best Overall Presentation Award at IEEE SWTW 2012
July 5, 2012
Advantest Introduces Industry's Highest Capability 3-in-1 Semiconductor Test Clock Module to Improve Yields and Save Time & Money in Testing High-Speed ICs
July 5, 2012
Advantest Breaks Ground for Cheonan, S. Korea Factory
July 4, 2012
Advantest Announces New Executive Appointments
June 26, 2012
Advantest to Launch CloudTesting (TM) Service in Fall 2012
June 5, 2012
Advantest Announces 3D TSV Stack Test Solutions
June 4, 2012
Advantest Announces Memory Test System T5811
June 4, 2012
Advantest Expo 2012 Visit the Leading Edge of the Future
May 30, 2012
Advantest Captures Highest Distinction in Annual Customer Satisfaction Survey (Link to Advantest America, Inc.)
May 24, 2012
Advantest Introduces T5511 High-Speed Memory Test System
May 14, 2012
Changes in Board Directors and Executive Officers (PDF: 85KB)
April 27, 2012
Advantest Successfully Develops Photoacoustic Imaging System
April 25, 2012
Advantest Corporation Receives Intel's Preferred Quality Supplier Award
April 12, 2012
Advantest Completes Integration of Verigy's Global Operations into its Corporate Structure
April 1, 2012
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